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Scanning White Light Interferometry / Optical Interferometry User - Friendly

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Scanning White Light Interferometry / Optical Interferometry User - Friendly

Name: Scanning White Light Interferometry / Optical Interferometry User - Friendly
Brand: Rational
SKU: White Light Interferometer
Rating: 4.6 (187 reviews)

Large Image : Scanning White Light Interferometry / Optical Interferometry User - Friendly

Product Details:

Place of Origin:	Guangdong China
Brand Name:	Rational
Certification:	CE SGS ISO
Model Number:	White Light Interferometer

Payment & Shipping Terms:

Minimum Order Quantity:	1 Set
Price:	Negotiable
Packaging Details:	Vacuum packing & free fumigation wooden case
Delivery Time:	After received down payment 5-15workdays
Payment Terms:	L/C, D/A, D/P, T/T
Supply Ability:	10000 set per month

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Detailed Product Description

Measuring Range:	100um( Up To 400um)	Average Service Life:	1000hours(100W) 500hours(150W)
Resolution:	0.1nm	Power:	AC 100-240V 50/60HZ
Scan Speed:	The Fastest 12um/s	Brand Name:	Rational
High Light:	optical surface profiler , vertical scanning interferometry

Scanning White Light Interferometry / Optical Interferometry User - Friendly

Product brief:

Combined with microscope and interferometer, the White Light Interferometer, with 3D measurement of vertical scanning height of 400um, is suitable for outline and profile measurement of various materials and micro components. This instrument doesn’t need program amended by complex light. It’s widely used in glass lens, surface of coating film, wafer, disk, MEMS(micro electro mechanical system), plane LCD, high density PCB, IC packaging, material analysis, micro surface research, etc.

Features:

1. 3D measurement for nanoscale object.
2. High speed and non-contact.
3. Analysis of surface, profile and roughness.
4. Transparent or non-transparent materials available.
5. Non-electron beam and non-laser security measurement.
6. Low-cost maintenance.

Professional 3D graphic processing and analyzing software (Post Topo):
1. user-friendly human-computer interface.
2. Self-calibration for advanced standard film.
3. Linear analysis or regional analysis is available when analyzing depth and height.
4. Linear analysis is available in roughness or waviness defined by ISO.
5. 17 measuring specifications and 4 additional measuring data available.
6. Regional analysis is available in graphic analysis or statistic analysis.
7. 2D Fast Fourier Transform (FFT) processing feature like smoothing, sharpening, and digital filtration wave.
8. Analysis result output into multiple graphic files like BMP, or into Excel format by interferometer analyzing software, ImgScan.

High speed and high precision Interference Analysis Software (ImgScan):

1. The system’s hardware is configured with ImgScan pre-processing software to automatically analyze white-light fringe.
2. Vertical height is up to 0.1nm.
3. High speed computing and analyzing software.
4. The setup of vertical scanning range is easy and simple.
5. Lens is available in 10X, 20X or 50X.
6. Numerical display of X, Y and Z axis, which makes measured object faster and more convenient to detect.
7. Manual/ automatic brightness is available to acquire the best comparison of white-light fringe.
8. Available in high precision PVSI scanning measurement mode or high speed VSI scanning measurement mode.
9. Patented analyzing software is suitable for measuring 3D profile of semi-transparent object.
10. Auto-repair point.
11. Scanning direction can be set by user.

Specifications:

Model	AE-100M
Moving Table (mm)	Size: 100100, travel: 1313
Lens Magnification	10X	20X	50X
Observing /Measuring Range (mm)	0.43*0.32	0.21*0.16	0.088*0.066
Resolution (μm)	0.92	0.69	0.5
Degrees	17	23	33
Working distance	7.4	4.7	3.4
Sensor’s resolution	pixel: 640*480
Weight/ Load (kg)	20kg/ Less than 1kg
Z-axis travel	45mm (manually fine tuning)
Z-axis digital display	Resolution: 1μm
Inclined adjusting platform	Biax/ Manual adjustment
Height measurement
Measuring range	100(μm)(400μm. Optional configuration)
Resolution	0.1nm
Repeated accuracy	≤ 0.1％ (Measuring height>10μm)
	≤10nm(Measuring height1μm 10μm)
	≤ 5nm(Measuring height <1μm )
Measuring control system	Automatic
Scanning speed (μm/s)	12 (the fastest)
Illumination
Type	Halogen lamp
Average lifespan	1000h 100W 500h(150W)
Brightness	Automatically / Manually adjust
Data processing and computer
Central processing and computing display	Dual core+ CUP
Video and data processing display	17 " LCD screen
OS	Windows XP(2)
Power supply and environmental requirements	AC100 --240 V 50-60Hz
Environmental vibration	VVC-C plus level
Measuring and analyzing softwares
Measuring software ImgScan	Measuring software ImgScan: available in VSI/PVSI/PSI measuring mode (PSI measuring mode must be configured with PSI module)
Analyzing software PosTopo	ISO roughness / height analysis, multiple 2D and 3D fast fourier transforms. Observe viewing graph like outline; outline, area, and volume analysis; graph zooming; video file format conversion. Report output; program teach-in measurement.