Home ProductsWhite Light Interferometry

Professional White Light Interferometry Self - Calibration For Advanced Standard Film

Certification
Good quality Video Measuring System for sales
Good quality Video Measuring System for sales
I have got your instruments and be impressed for the first sight, it is really very convenient for operation.

—— William

It is my pleasure to represent your company's products.

—— Nancy

Thank you for your support of us.

—— Paul

Thanks for the great service and support for us, we would like to cooperate with you all the time.

—— Tom

Our customer has tested the machine, now it works well, thank you. We will order more in near future.

—— Jabbar

“Rational” international brand , Very happy to be your agent

—— Simon

I'm Online Chat Now

Professional White Light Interferometry Self - Calibration For Advanced Standard Film

Professional White Light Interferometry  Self - Calibration For Advanced Standard Film
Professional White Light Interferometry  Self - Calibration For Advanced Standard Film

Large Image :  Professional White Light Interferometry Self - Calibration For Advanced Standard Film

Product Details:

Place of Origin: Guangdong China
Brand Name: Rational
Certification: CE SGS ISO
Model Number: White Light Interferometer

Payment & Shipping Terms:

Minimum Order Quantity: 1 Set
Price: Negotiable
Packaging Details: Vacuum packing & free fumigation wooden case
Delivery Time: After received down payment 5-15workdays
Payment Terms: L/C, D/A, D/P, T/T
Supply Ability: 10000 set per month
Detailed Product Description
Measuring Range: 100um( Up To 400um) Average Service Life: 1000hours(100W) 500hours(150W)
Resolution: 0.1nm Power: AC 100-240V 50/60HZ
Scan Speed: The Fastest 12um/s Brand Name: Rational
High Light:

optical interferometry

,

optical surface profiler

AE-100M White Light Interferometer and Optical Surface Profilers


Product brief:


Combined with microscope and interferometer, the White Light Interferometer, with 3D measurement of vertical scanning height of 400um, is suitable for outline and profile measurement of various materials and micro components. This instrument doesn’t need program amended by complex light. It’s widely used in glass lens, surface of coating film, wafer, disk, MEMS(micro electro mechanical system), plane LCD, high density PCB, IC packaging, material analysis, micro surface research, etc.
 

Features:


1. 3D measurement for nanoscale object.
2. High speed and non-contact.
3. Analysis of surface, profile and roughness.
4. Transparent or non-transparent materials available.
5. Non-electron beam and non-laser security measurement.
6. Low-cost maintenance.

Professional 3D graphic processing and analyzing software (Post Topo):
1. user-friendly human-computer interface.
2. Self-calibration for advanced standard film.
3. Linear analysis or regional analysis is available when analyzing depth and height.
4. Linear analysis is available in roughness or waviness defined by ISO.
5. 17 measuring specifications and 4 additional measuring data available.
6. Regional analysis is available in graphic analysis or statistic analysis.
7. 2D Fast Fourier Transform (FFT) processing feature like smoothing, sharpening, and digital filtration wave.
8. Analysis result output into multiple graphic files like BMP, or into Excel format by interferometer analyzing software, ImgScan.

 

High speed and high precision Interference Analysis Software (ImgScan):


1. The system’s hardware is configured with ImgScan pre-processing software to automatically analyze white-light fringe.
2. Vertical height is up to 0.1nm.
3. High speed computing and analyzing software.
4. The setup of vertical scanning range is easy and simple.
5. Lens is available in 10X, 20X or 50X.
6. Numerical display of X, Y and Z axis, which makes measured object faster and more convenient to detect.
7. Manual/ automatic brightness is available to acquire the best comparison of white-light fringe.
8. Available in high precision PVSI scanning measurement mode or high speed VSI scanning measurement mode.
9. Patented analyzing software is suitable for measuring 3D profile of semi-transparent object.
10. Auto-repair point.
11. Scanning direction can be set by user.

Specifications:

 

Model AE-100M
Moving Table (mm) Size: 100*100, travel: 13*13
Lens Magnification 10X 20X 50X
Observing /Measuring Range (mm) 0.43*0.32 0.21*0.16 0.088*0.066
Resolution (μm) 0.92 0.69 0.5
Degrees 17 23 33
Working distance 7.4 4.7 3.4
Sensor’s resolution pixel: 640*480
Weight/ Load (kg) 20kg/ Less than 1kg
Z-axis travel 45mm (manually fine tuning)
Z-axis digital display Resolution: 1μm
Inclined adjusting platform Biax/ Manual adjustment
Height measurement
Measuring range 100(μm)(400μm. Optional configuration)
Resolution 0.1nm
Repeated accuracy ≤ 0.1% (Measuring height>10μm)
≤10nm(Measuring height1μm 10μm)
≤ 5nm(Measuring height <1μm )
Measuring control system Automatic
Scanning speed (μm/s) 12 (the fastest)
Illumination
Type Halogen lamp
Average lifespan 1000h 100W 500h(150W)
Brightness Automatically / Manually adjust
Data processing and computer
Central processing and computing display Dual core+ CUP
Video and data processing display 17 " LCD screen
OS Windows XP(2)
Power supply and environmental requirements AC100 --240 V 50-60Hz
Environmental vibration VVC-C plus level
Measuring and analyzing softwares
Measuring software ImgScan Measuring software ImgScan: available in VSI/PVSI/PSI measuring mode (PSI measuring mode must be configured with PSI module)
Analyzing software PosTopo ISO roughness / height analysis, multiple 2D and 3D fast fourier transforms.
Observe viewing graph like outline; outline, area, and volume analysis; graph zooming; video file format conversion.
Report output; program teach-in measurement.

 

 

 

 

 

Contact Details
Rational Precision Instrument Co.,Ltd.

Contact Person: Sunny

Send your inquiry directly to us (0 / 3000)